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 MILITARY DATA SHEET MN54F38-X REV 1A0
Original Creation Date: 03/12/96 Last Update Date: 07/30/96 Last Major Revision Date: 03/12/96
QUAD 2-INPUT NAND BUFFER (OPEN COLLECTOR)
General Description
The device contains four independent gates, each of which performs the logic NAND function. The open-collector outputs require external pull-up resistors for proper logical operation.
Industry Part Number
54F38
NS Part Numbers
54F38DMQB 54F38FMQB 54F38LMQB
Prime Die
M038
Processing
MIL-STD-883, Method 5004
Subgrp Description
1 2 3 4 5 6 7 8A 8B 9 10 11 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at
Temp ( oC)
+25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55
Quality Conformance Inspection
MIL-STD-883, Method 5005
1
MN54F38-X REV 1A0
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note 1) Storage Temperature -65 C to +150 C Ambient Temperature under Bias -55 C to +125 C Junction Temperature under Bias -55 C to +175 C Vcc Pin Potential to Ground Pin -0.5V to +7.0V Input Voltage (Note 2) -0.5V to +7.0V Input Current (Note 2) -30 mA to +5.0mA Voltage Applied to Output in HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied to Output in LOW State (Max) ESD Last Passing Voltage (Min) 4000V Note 1: Note 2: Absolute Maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Either voltage limit or current limit is sufficient to protect inputs. -0.5V to Vcc -0.5V to +5.5V twice the rated Iol(mA)
Recommended Operating Conditions
Free Air Ambient Temperature Commercial Military Supply Voltage Military Commercial 0 C to +70 C -55 C to +125 C +4.5V to +5.5V +4.5V to +5.5V
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MN54F38-X REV 1A0
MILITARY DATA SHEET
Electrical Characteristics
DC PARAMETER
(The following conditions apply to all the following parameters, unless otherwise specified.) DC: VCC 4.5V to 5.5V, Temp range: -55C to 125C SYMBOL IIH IBVI IIL IOH VOLB VCD ICCH ICCL PARAMETER Input High Current Input High Current Input LOW Current Open Collector Output Output LOW Voltage Input Clamp Diode Voltage Supply Current Supply Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=7.0V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=0.5V, VINH=5.5V, VINL=0.0V VCC=4.5V, VM=4.5V, VIL=0.8V, VINH=5.5V VCC=4.5V, VIL=0.8V, VIH=2.0V, IOLB=48mA, VINH=5.5V VCC=4.5V, IM=-18mA, VINH=5.5V VCC=5.5V, VINL=0.0V, VINH=5.5V VCC=5.5V, VINL=0.0V, VINH=5.5V NOTES PINNAME MIN MAX 20 100 -1.2 250 .55 -1.2 7.0 30.0 UNIT uA uA mA uA V V mA mA SUBGROUPS 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3
1, 3 INPUTS 1, 3 INPUTS 1, 3 INPUTS 1, 3 OUTPUTS 1, 3 OUTPUTS 1, 3 INPUTS 1, 3 VCC 1, 3 VCC
AC PARAMETER
(The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns SEE AC FIGS tpLH Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V @-55/125C 2, 4 An/Bn to On 2, 4 An/Bn to On tpHL Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V @-55/125C 2, 4 An/Bn to On 2, 4 An/Bn to On Note 1: Note 2: Note 3: Note 4: 6.5 6.5 1.0 1.0 12.5 14.5 5.0 5.5 ns ns ns ns 9 10, 11 9 10, 11
Screen tested 100% on each device at +25C, +125C & -55C temperature, subgroups A1, 2, 3, 7 & 8. Screen tested 100% on each device at +25C temperature only, subgroup A9. Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C temperature, subgroups A1, 2, 3, 7 & 8. Sample tested (Method 5005, table 1) on each MFG. lot at +25C subgroup A9, and periodically at +125C & -55C temperature, subgroups 10 & 11.
3
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